Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Ele...

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev (Eng

CMOS VLSI Design: A Circuits and Systems Perspective (4th Edition)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - 9781441942852

Sachdev - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - - X555z

CMOS VLSI Design: A Circuits and Systems Perspective - Weste, Neil - hardcover

CMOS VLSI Design: A Circuits and - Hardcover, by Weste Neil; Harris - Acceptable

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition by Manoj