SEM Electron Gun Scanning Electron Microscope High Volt Ion Source X-Ray

AS IS SEM Electron Gun Scanning Electron Microscope High Volt Ion Source X-Ray

AS IS UNTESTED FEI 4022-262-26331 CLM SEM COLUMN ASSY

AS IS UNTESTED FEI Company 4022 262 35472 Controller

FEI Company 4022 262 35472 Controller / Manual User Interface

high current electrical feedthrough, Single 0.375" conductor, conflat CF133

FEI 1140883 Sample Bake-Out Assembly Box Thermo Fisher Cryo-FIB SEM Microscope

FEI 4022 262 31661 cable